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Proceedings Paper

Development of quantitative diagnostic observables for age-related macular degeneration using Spectral Domain OCT
Author(s): Bradley A. Bower; Stephanie J. Chiu; Emily Davies; Anjul M. Davis; Robert J. Zawadzki; Alfred R. Fuller; David F. Wiley; Joseph A. Izatt; Cynthia A. Toth
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Paper Abstract

We report on the development of quantitative, reproducible diagnostic observables for age-related macular degeneration (AMD) based on high speed spectral domain optical coherence tomography (SDOCT). 3D SDOCT volumetric data sets (512 x 1000 x 100 voxels) were collected (5.7 seconds acquisition time) in over 50 patients with age-related macular degeneration and geographic atrophy using a state-of-the-art SDOCT scanner. Commercial and custom software utilities were used for manual and semi-automated segmentation of photoreceptor layer thickness, total drusen volume, and geographic atrophy cross-sectional area. In a preliminary test of reproducibility in segmentation of total drusen volume and geographic atrophy surface area, inter-observer error was less than 5%. Extracted volume and surface area of AMD-related drusen and geographic atrophy, respectively, may serve as useful observables for tracking disease state that were not accessible without the rapid 3D volumetric imaging capability unique to retinal SDOCT.

Paper Details

Date Published: 5 March 2007
PDF: 7 pages
Proc. SPIE 6426, Ophthalmic Technologies XVII, 64260W (5 March 2007); doi: 10.1117/12.704689
Show Author Affiliations
Bradley A. Bower, Duke Univ. (United States)
Stephanie J. Chiu, Duke Univ. (United States)
Emily Davies, Duke Univ. Medical Ctr. (United States)
Anjul M. Davis, Duke Univ. (United States)
Robert J. Zawadzki, Univ. of California at Davis (United States)
Alfred R. Fuller, Univ. of California at Davis (United States)
David F. Wiley, Univ. of California at Davis (United States)
Joseph A. Izatt, Duke Univ. (United States)
Cynthia A. Toth, Duke Univ. Medical Ctr. (United States)


Published in SPIE Proceedings Vol. 6426:
Ophthalmic Technologies XVII
Bruce E. Stuck; Fabrice Manns; Per G. Söderberg; Michael Belkin; Arthur Ho, Editor(s)

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