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Proceedings Paper

The intermediate size direct detection detector for electron microscopy
Author(s): Liang Jin; Anna-Clare Milazzo; Stuart Kleinfelder; Shengdong Li; Philippe Leblanc; Fred Duttweiler; James C. Bouwer; Steve T. Peltier; Mark Ellisman; Nguyen-Huu Xuong
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Paper Abstract

In a longstanding effort to overcome limits of film and the charge coupled device (CCD) systems in electron microscopy, we have developed a radiation-tolerant system that can withstand direct electron bombardment. A prototype Direct Detection Device (DDD) detector based on an Active Pixel Sensor (APS) has delivered unprecedented performance with an excellent signal-to-noise ratio (approximately 5/1 for a single incident electron in the range of 200-400 keV) and a very high spatial resolution. This intermediate size prototype features a 512×550 pixel format of 5&mgr;m pitch. The detector response to uniform beam illumination and to single electron hits is reported. Radiation tolerance with high-energy electron exposure is also impressive, especially with cooling to -15 °C. Stable performance has been demonstrated, even after a total dose of 3.3×106 electrons/pixel. The characteristics of this new detector have exciting implications for transmission electron microscopy, especially for cryo-EM as applied to biological macromolecules.

Paper Details

Date Published: 21 February 2007
PDF: 8 pages
Proc. SPIE 6501, Sensors, Cameras, and Systems for Scientific/Industrial Applications VIII, 65010A (21 February 2007); doi: 10.1117/12.704329
Show Author Affiliations
Liang Jin, Univ. of California, San Diego (United States)
Anna-Clare Milazzo, Univ. of California, San Diego (United States)
Stuart Kleinfelder, Univ. of California, Irvine (United States)
Shengdong Li, Univ. of California, Irvine (United States)
Philippe Leblanc, Univ. of California, San Diego (United States)
Fred Duttweiler, Univ. of California, San Diego (United States)
James C. Bouwer, Univ. of California, San Diego (United States)
Steve T. Peltier, Univ. of California, San Diego (United States)
Mark Ellisman, Univ. of California, San Diego (United States)
Nguyen-Huu Xuong, Univ. of California, San Diego (United States)


Published in SPIE Proceedings Vol. 6501:
Sensors, Cameras, and Systems for Scientific/Industrial Applications VIII
Morley M. Blouke, Editor(s)

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