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Proceedings Paper

Bad pixel location algorithm for cell phone cameras
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Paper Abstract

As CMOS imaging technology advances, sensor to sensor differences increase, creating an increasing need for individual, per sensor, calibration. Traditionally, the cell-phone market has a low tolerance for complex per unit calibration. This paper proposes an algorithm that eliminates the need for a complex test environment and does not require a manufacturing based calibration on a per phone basis. The algorithm locates "bad pixels", pixels with light response characteristics out of the mean range of the values specified by the manufacturer in terms of light response. It uses several images captured from a sensor without using a mechanical shutter or predefined scenes. The implementation that follows uses two blocks: a dynamic detection block (local area based) and a static correction block (location table based). The dynamic block fills the location table of the static block using clustering techniques. The result of the algorithm is a list of coordinates containing the location of the found 'bad pixels'. An example is given of how this method can be applied to several different cell-phone CMOS sensors.

Paper Details

Date Published: 20 February 2007
PDF: 10 pages
Proc. SPIE 6502, Digital Photography III, 65020H (20 February 2007); doi: 10.1117/12.702955
Show Author Affiliations
Sergio Goma, AMD (Canada)
Milivoje Aleksic, AMD (Canada)


Published in SPIE Proceedings Vol. 6502:
Digital Photography III
Russel A. Martin; Jeffrey M. DiCarlo; Nitin Sampat, Editor(s)

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