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Proceedings Paper

Micro-displacement measurements with moiré patterns of Fresnel zone plates films
Author(s): M. Pérez-Cortés; M. Ortiz-Gutiérrez; J. C. Ibarra; A. Olivares-Pérez; J. Becerra-Macías
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Paper Abstract

In this work we propose a technique to measure micro displacements using Moiré patterns of Fresnel zone plates films. In this technique the pattern is placed on a mechanical mount and the displacements are measured counting the displaced fringes of an amplified moire image as the mount is moving.

Paper Details

Date Published: 6 February 2007
PDF: 8 pages
Proc. SPIE 6489, Projection Displays XII, 64890G (6 February 2007); doi: 10.1117/12.701285
Show Author Affiliations
M. Pérez-Cortés, Univ. Autónoma de Yucatán (Mexico)
M. Ortiz-Gutiérrez, Univ. Michoacana de San Nicolás de Hidalgo (Mexico)
J. C. Ibarra, Univ. de Guadalajara (Mexico)
A. Olivares-Pérez, Instituto Nacional de Astrofísica, Óptica y Electrónica (Mexico)
J. Becerra-Macías, Digital Optical Quantum Electronics (Mexico)


Published in SPIE Proceedings Vol. 6489:
Projection Displays XII
Ming H. Wu; Hoang Y. Lin, Editor(s)

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