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Proceedings Paper

A study by GISAXS of PbTe/SiO2 multilayer deposited on Si(111)
Author(s): G. Kellermann; E. Rodriguez; E. Jimenez; E. Chillcce; C. L. Cesar; L. C. Barbosa
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Paper Abstract

Multilayers of PbTe quantum dots embedded in SiO2 were fabricated by alternatively use of Laser Ablation and Plasma Enhanced Chemical Vapor Deposition techniques. A set o samples containing different PbTe nanoparticles sizes was prepared for the study. The morphological properties of the nanostructured material were studied by means of grazing-incidence small-angle X-ray scattering (GISAXS) and x-ray reflectometry (XRR) techniques. A preliminary analysis of the GISAXS spectra provided information about the multilayer periodicity and its relationship to the size of the deposited PbTe nanoparticles.

Paper Details

Date Published: 6 February 2007
PDF: 6 pages
Proc. SPIE 6481, Quantum Dots, Particles, and Nanoclusters IV, 64810A (6 February 2007); doi: 10.1117/12.701082
Show Author Affiliations
G. Kellermann, Univ. Estadual de Campinas (Brazil)
E. Rodriguez, Univ. Estadual de Campinas (Brazil)
E. Jimenez, Univ. Estadual de Campinas (Brazil)
E. Chillcce, Univ. Estadual de Campinas (Brazil)
C. L. Cesar, Univ. Estadual de Campinas (Brazil)
L. C. Barbosa, Univ. Estadual de Campinas (Brazil)


Published in SPIE Proceedings Vol. 6481:
Quantum Dots, Particles, and Nanoclusters IV
Kurt G. Eyink; Diana L. Huffaker; Frank Szmulowicz, Editor(s)

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