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Proceedings Paper

Analysis of substrate modes in GaN/InGaN lasers
Author(s): Bernd Witzigmann; Valerio Laino; Friedhard Roemer; Christoph Lauterbach; Ulrich T. Schwarz; Christian Rumbolz; Martin O. Schillgalies; Alfred Lell; Uwe Strauss; Volker Härle
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Paper Abstract

In this contribution, substrate modes in edge-emitting lasers in the material system Gallium-Nitride are analyzed by means of comprehensive measurements and simulations. The simulations are complex vectorial optical mode calculations using a finite-element method. The simulation domain comprises the ridge waveguide and the full substrate with open boundary conditions on the sides. Therefore, the coupling mechanisms of the waveguides formed by the ridge and the substrate can be analyzed in a realistic setup. The characterization data include the optical loss spectrum obtained from Hakki-Paoli measurements, optical near field, and farfield measurements. The devices used for characterization are ridge waveguide quantum well lasers grown on GaN substrates. A comparison of the measurement data with the simulations explains the characteristics of the substrate modes in a consistent way, and shows very good agreement for the optical loss oscillations, farfield angle, and nearfield pattern. It is shown that material losses, material dispersion and optical diffraction are key ingredients for the analysis of substrate modes.

Paper Details

Date Published: 23 March 2007
PDF: 8 pages
Proc. SPIE 6468, Physics and Simulation of Optoelectronic Devices XV, 64680Q (23 March 2007); doi: 10.1117/12.700920
Show Author Affiliations
Bernd Witzigmann, ETH Zürich (Switzerland)
Valerio Laino, ETH Zürich (Switzerland)
Friedhard Roemer, ETH Zürich (Switzerland)
Christoph Lauterbach, Univ. of Regensburg (Germany)
Ulrich T. Schwarz, Univ. of Regensburg (Germany)
Christian Rumbolz, Univ. of Regensburg (Germany)
Martin O. Schillgalies, Osram Opto Semiconductors (Germany)
Alfred Lell, Osram Opto Semiconductors (Germany)
Uwe Strauss, Osram Opto Semiconductors (Germany)
Volker Härle, Osram Opto Semiconductors (Germany)


Published in SPIE Proceedings Vol. 6468:
Physics and Simulation of Optoelectronic Devices XV
Marek Osinski; Fritz Henneberger; Yasuhiko Arakawa, Editor(s)

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