
Proceedings Paper
Optical monitoring of the chorioretinal status during retinal laser thermotherapyFormat | Member Price | Non-Member Price |
---|---|---|
$14.40 | $18.00 |
![]() |
GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. | Check Access |
Paper Abstract
As a consequence of pigmentation inhomogeneities and/or different vascularizations of the retinal tissue, retinal laser
thermo-treatments are often over- or under-exposed. Our study is focused on the determination of suitable parameters to
identify a convenient end-point of the laser treatment. The proposed method is based on the analysis of the temporal
fluctuations of the scattered light intensity from the spot area. Motion of molecules and thus frequency of the scattered
light fluctuations changes during the laser exposure due to variations of temperature, blood flow and optical parameters,
i.e. absorption and scattering coefficient.
Paper Details
Date Published: 5 March 2007
PDF: 8 pages
Proc. SPIE 6426, Ophthalmic Technologies XVII, 642618 (5 March 2007); doi: 10.1117/12.700769
Published in SPIE Proceedings Vol. 6426:
Ophthalmic Technologies XVII
Bruce E. Stuck; Fabrice Manns; Per G. Söderberg; Michael Belkin; Arthur Ho, Editor(s)
PDF: 8 pages
Proc. SPIE 6426, Ophthalmic Technologies XVII, 642618 (5 March 2007); doi: 10.1117/12.700769
Show Author Affiliations
Luigi Rovati, Univ. of Modena and Reggio Emilia (Italy)
INFM (Italy)
Nicola Zambelli, Univ. of Modena and Reggio Emilia (Italy)
INFM (Italy)
Stefano Cattini, Univ. of Modena and Reggio Emilia (Italy)
INFM (Italy)
INFM (Italy)
Nicola Zambelli, Univ. of Modena and Reggio Emilia (Italy)
INFM (Italy)
Stefano Cattini, Univ. of Modena and Reggio Emilia (Italy)
INFM (Italy)
Francesco Viola, Univ. of Milano (Italy)
Giovanni Staurenghi, Univ. of Milano (Italy)
Giovanni Staurenghi, Univ. of Milano (Italy)
Published in SPIE Proceedings Vol. 6426:
Ophthalmic Technologies XVII
Bruce E. Stuck; Fabrice Manns; Per G. Söderberg; Michael Belkin; Arthur Ho, Editor(s)
© SPIE. Terms of Use
