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Proceedings Paper

Optical and x-ray characterization of two novel CMOS image sensors
Author(s): Sarah E. Bohndiek; Costas D. Arvanitis; Cristian Venanzi; Gary J. Royle; Andy T. Clark; Jamie P. Crooks; Mark L. Prydderch; Renato Turchetta; Andrew Blue; Robert D. Speller
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Paper Abstract

A UK consortium (MI3) has been founded to develop advanced CMOS pixel designs for scientific applications. Vanilla, a 520x520 array of 25&mgr;m pixels benefits from flushed reset circuitry for low noise and random pixel access for region of interest (ROI) readout. OPIC, a 64x72 test structure array of 30&mgr;m digital pixels has thresholding capabilities for sparse readout at 3,700fps. Characterization is performed with both optical illumination and x-ray exposure via a scintillator. Vanilla exhibits 34±3e- read noise, interactive quantum efficiency of 54% at 500nm and can read a 6x6 ROI at 24,395fps. OPIC has 46±3e- read noise and a wide dynamic range of 65dB due to high full well capacity. Based on these characterization studies, Vanilla could be utilized in applications where demands include high spectral response and high speed region of interest readout while OPIC could be used for high speed, high dynamic range imaging.

Paper Details

Date Published: 9 February 2007
PDF: 12 pages
Proc. SPIE 6471, Ultrafast Phenomena in Semiconductors and Nanostructure Materials XI and Semiconductor Photodetectors IV, 647113 (9 February 2007); doi: 10.1117/12.700581
Show Author Affiliations
Sarah E. Bohndiek, Univ. College London (United Kingdom)
Costas D. Arvanitis, Univ. College London (United Kingdom)
Cristian Venanzi, Univ. College London (United Kingdom)
Gary J. Royle, Univ. College London (United Kingdom)
Andy T. Clark, CCLRC Rutherford Appleton Lab. (United Kingdom)
Jamie P. Crooks, CCLRC Rutherford Appleton Lab. (United Kingdom)
Mark L. Prydderch, CCLRC Rutherford Appleton Lab. (United Kingdom)
Renato Turchetta, CCLRC Rutherford Appleton Lab. (United Kingdom)
Andrew Blue, Univ. of Glasgow (United Kingdom)
Robert D. Speller, Univ. College London (United Kingdom)


Published in SPIE Proceedings Vol. 6471:
Ultrafast Phenomena in Semiconductors and Nanostructure Materials XI and Semiconductor Photodetectors IV
Marshall J. Cohen; Kong-Thon Tsen; Joseph P. Estrera; Jin-Joo Song, Editor(s)

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