Share Email Print
cover

Proceedings Paper

Digital holographic microscopy for nanometric quality control of micro-optical components
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

In this paper, Digital Holographic Microscopy (DHM) is presented as a powerful tool for quality control of microoptical components. It will be shown that not only the single-shot full field-of-view nanometer axial resolution makes DHM an ideal solution for such samples, but the DHM numerical wavefront correction formalism is perfectly adapted to provide advanced features like aberration coefficients, radius of curvature or optical surfaces roughness measurements. Both transmission and reflection configurations can be used depending of the micro-components under investigation. A transparent high aspect-ratio micro-components investigation procedure is also exposed in order to unable phase unwrapping. Each feature is illustrated with typical examples, ranging from a wide variety of micro-lenses (aspherical, cylindrical, squared) to cornercube micro-structures or diffractive elements.

Paper Details

Date Published: 9 February 2007
PDF: 12 pages
Proc. SPIE 6475, Integrated Optics: Devices, Materials, and Technologies XI, 64750V (9 February 2007); doi: 10.1117/12.700523
Show Author Affiliations
Jonas Kühn, École Polytechnique Fédérale de Lausanne (Switzerland)
Florian Charrière, École Polytechnique Fédérale de Lausanne (Switzerland)
Tristan Colomb, École Polytechnique Fédérale de Lausanne (Switzerland)
DP-CHUV (Switzerland)
Etienne Cuche, Lyncée Tec SA (Switzerland)
Yves Emery, Lyncée Tec SA (Switzerland)
Christian Depeursinge, École Polytechnique Fédérale de Lausanne (Switzerland)


Published in SPIE Proceedings Vol. 6475:
Integrated Optics: Devices, Materials, and Technologies XI
Yakov Sidorin; Christoph A. Waechter, Editor(s)

© SPIE. Terms of Use
Back to Top