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Proceedings Paper

1.3 &mgr;m VCSELs: InGaAs/GaAs, GaInNAs/GaAs multiple quantum wells, and InAs/GaAs quantum dots — three candidates as active material
Author(s): Ph. Gilet; E. Pougeoise; L. Grenouillet; Ph. Grosse; N. Olivier; S. Poncet; A. Chelnokov; J. M. Gérard; R. Stevens; R. Hamelin; M. Hammar; J. Berggren; P. Sundgren
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Paper Abstract

In this article, we report our results on 1.3&mgr;m VCSELs for optical interconnection applications. Room temperature continuous-wave lasing operation is demonstrated for top emitting oxide-confined devices with three different active materials, highly strained InGaAs/GaAs(A) and GaInNAs/GaAs (B) multiple quantum wells (MQW) or InAs/GaAs (C) quantum dots (QD). Conventional epitaxial structures grown respectively by Metal Organic Vapour Phase Epitaxy (MOVPE), Molecular Beam Epitaxy (MBE) and MBE, contain fully doped GaAs/AlGaAs DBRs. All three epilayers are processed in the same way. Current and optical confinement are realized by selective wet oxidation. Circular apertures from 2 (micron)m to 16 (micron)m diameters are defined. At room temperature and in continuous wave operation, all three systems exhibit lasing operation at wavelengths above 1 275nm and reached 1 300nm for material (A). Typical threshold currents are in the range [1- 10]mA and are strongly dependent firstly on oxide diameter and secondly on temperature. Room temperature cw maximum output power corresponds respectively to 1.77mW, 0.5mW and 0.6mW. By increasing driving current, multimode operation occurs at different level depending on the oxide diameter. In case (A), non conventional modal behaviors will be presented and explained by the presence of specific oxide modes. Thermal behaviors of the different devices have been compared. In case (A) and (C) we obtain a negative T0. We will conclude on the different active materials in terms of performances with respect to 1300nm VCSEL applications.

Paper Details

Date Published: 23 February 2007
PDF: 10 pages
Proc. SPIE 6484, Vertical-Cavity Surface-Emitting Lasers XI, 64840F (23 February 2007); doi: 10.1117/12.700403
Show Author Affiliations
Ph. Gilet, CEA-Léti MINATEC (France)
E. Pougeoise, CEA-Léti MINATEC (France)
L. Grenouillet, CEA-Léti MINATEC (France)
Ph. Grosse, CEA-Léti MINATEC (France)
N. Olivier, CEA-Léti MINATEC (France)
S. Poncet, CEA-Léti MINATEC (France)
A. Chelnokov, CEA-Léti MINATEC (France)
J. M. Gérard, CEA-Grenoble DRFMC (France)
R. Stevens, Intexys Photonics (France)
R. Hamelin, Intexys Photonics (France)
M. Hammar, Royal Institute of Technology (Sweden)
J. Berggren, Royal Institute of Technology (Sweden)
P. Sundgren, Royal Institute of Technology (Sweden)


Published in SPIE Proceedings Vol. 6484:
Vertical-Cavity Surface-Emitting Lasers XI
Kent D. Choquette; James K. Guenter, Editor(s)

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