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Proceedings Paper

Novel high-sensitivity thermal managed eclipse Z-scan technique
Author(s): Anderson S. L. Gomes; Edilson L. Falcão Filho; Cid B. de Araújo; Diego Rativa; Renato E. de Araujo
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Paper Abstract

The field of Nonlinear Optics has provided many techniques to characterize photonic materials. The Z-scan method is a well estabileshed technique that exploits front wave distortions of the light beam to determine the nonlinear properties of optical materials. Several variations of the methods have been developed, as the eclipse Z-scan that can provide up to two orders of magnitude higher sensitivity than the original Z-scan set-up. We report a new variation of the Z-scan method to characterize the third-order optical nonlinearity of photonic materials. By exploiting the combination of the eclipse Z-scan with thermal nonlinearity management, we demonstrate an improvement in sensitivity and flexibility of the method to simultaneously characterize the thermal and nonthermal nonlinearity of optical materials. The method is demonstrated by measuring the nonlinear refractive index in CS2, SiO2 and H2O as standard materials, and also of a biomaterial, the amino acid Tryptophan in water solution, using the same experimental set up based on a femtosecond Ti-saphire laser operating at 76MHz repetition rate.

Paper Details

Date Published: 14 February 2007
PDF: 7 pages
Proc. SPIE 6455, Nonlinear Frequency Generation and Conversion: Materials, Devices, and Applications VI, 64550Z (14 February 2007); doi: 10.1117/12.700348
Show Author Affiliations
Anderson S. L. Gomes, Federal Univ. of Pernambuco (Brazil)
Edilson L. Falcão Filho, Federal Univ. of Pernambuco (Brazil)
Cid B. de Araújo, Federal Univ. of Pernambuco (Brazil)
Diego Rativa, Federal Univ. of Pernambuco (Brazil)
Renato E. de Araujo, Federal Univ. of Pernambuco (Brazil)

Published in SPIE Proceedings Vol. 6455:
Nonlinear Frequency Generation and Conversion: Materials, Devices, and Applications VI
Peter E. Powers, Editor(s)

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