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Proceedings Paper

Concentration dependence of the fluorescence decay profile in transition metal doped chalcogenide glass
Author(s): M. Hughes; D. W. Hewak; R. J. Curry
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Paper Abstract

In this paper we present the fluorescence decay profiles of vanadium and titanium doped gallium lanthanum sulphide (GLS) glass at various doping concentrations between 0.01 and 1% (molar). We demonstrate that below a critical doping concentration the fluorescence decay profile can be fitted with the stretched exponential function: exp[-(t/&tgr;)&bgr;], where &tgr; is the fluorescence lifetime and &bgr; is the stretch factor. At low concentrations the lifetime for vanadium and titanium doped GLS was 30 &mgr;s and 67 &mgr;s respectively. We validate the use of the stretched exponential model and discuss the possible microscopic phenomenon it arises from. We also demonstrate that above a critical doping concentration of around 0.1% (molar) the fluorescence decay profile can be fitted with the double exponential function: a*exp-(t/&tgr;1)+ b*exp-(t/&tgr;2), where &tgr;1 and &tgr;2 are characteristic fast and slow components of the fluorescence decay profile, for vanadium the fast and slow components are 5 &mgr;s and 30 &mgr;s respectively and for titanium they are 15 &mgr;s and 67 &mgr;s respectively. We also show that the fluorescence lifetime of vanadium and titanium at low concentrations in the oxide rich host gallium lanthanum oxy-sulphide (GLSO) is 43 &mgr;s and 97 &mgr;s respectively, which is longer than that in GLS. From this we deduce that vanadium and titanium fluorescing ions preferentially substitute into high efficiency oxide sites until at a critical concentration they become saturated and low efficiency sulphide sites start to be filled.

Paper Details

Date Published: 20 February 2007
PDF: 9 pages
Proc. SPIE 6469, Optical Components and Materials IV, 64690D (20 February 2007); doi: 10.1117/12.699134
Show Author Affiliations
M. Hughes, Univ. of Southampton (United Kingdom)
D. W. Hewak, Univ. of Southampton (United Kingdom)
R. J. Curry, Univ. of Surrey (United Kingdom)


Published in SPIE Proceedings Vol. 6469:
Optical Components and Materials IV
Shibin Jiang; Michel J. F. Digonnet, Editor(s)

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