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Proceedings Paper

Narrowband Bragg reflectors in Ti:LiNbO3 optical waveguides and implantation to optical modulators
Author(s): R. Kim; J. Zhang; O. Eknoyan; H. F. Taylor; T. L. Smith
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Paper Abstract

Bragg grating reflectors etched in amorphous silicon overlay films have been integrated with Ti:LiNbO3 optical waveguides. Narrow (0.05 nm) reflectance spectrum with > 20 dB dip in the transmittance spectrum have been obtained at a wavelength of 1542.7 nm for TE polarization. The reflectance in the channel waveguides depends strongly on the depth of the etched grating. The effect of the Bragg waveguide loss factor on the transmittance and reflectance spectra is investigated using a model for contradirectional coupling that includes an attenuation coefficient. Good agreement between model predictions and experimental results is obtained. Applications of such integrated gratings in the fabrication of distributed feedback type and Fabry-Perot type electrooptic intensity modulators, for low switching voltage and high extinction needs, are demonstrated.

Paper Details

Date Published: 9 February 2007
PDF: 10 pages
Proc. SPIE 6475, Integrated Optics: Devices, Materials, and Technologies XI, 64750E (9 February 2007); doi: 10.1117/12.698772
Show Author Affiliations
R. Kim, Advanced Micro Devices (United States)
J. Zhang, 3M Corp. Research Materials Lab (United States)
O. Eknoyan, Texas A&M Univ. (United States)
H. F. Taylor, Texas A&M Univ. (United States)
T. L. Smith, 3M Corp. Research Materials Lab (United States)


Published in SPIE Proceedings Vol. 6475:
Integrated Optics: Devices, Materials, and Technologies XI
Yakov Sidorin; Christoph A. Waechter, Editor(s)

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