Share Email Print

Proceedings Paper

Evaluation of two and a half dimensional surface data with form component and groove bands
Author(s): Binjian Xin
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Machine work pieces with ground, broached or milled surfaces have frequently microtextures consisting of stochastically placed straight tool marks. In this paper we'll exploit the depth data acquired by white-light interferometer for the surface analysis. We present a new algorithm for efficiently extracting extensive groove bands from depth images. The images are treated as a composition of shape component, straight line structures and background. The cylindrical shape component is extracted using robust least squares methods. The outliers are removed by adaptive center weighted median filter. The undefined regions due to sensor failures are interpolated using successive over-relaxation algorithm. An algorithm for the separation of groove bands is introduced. Straight line in three-dimensional space is parameterized and used as primitive for groove separation. After having determined the orientation of the groove band, straight line segment produced with Digital Differential Analyzer can be used by the scanning algorithm for estimating the straight lines. This decomposition enables a separate evaluation of different components of the surface data. The results of the pre-processings and the separation turn out to be fast and robust, which is verified by real depth data.

Paper Details

Date Published: 17 February 2007
PDF: 10 pages
Proc. SPIE 6503, Machine Vision Applications in Industrial Inspection XV, 65030D (17 February 2007); doi: 10.1117/12.698505
Show Author Affiliations
Binjian Xin, Univ. of Karlsruhe (Germany)

Published in SPIE Proceedings Vol. 6503:
Machine Vision Applications in Industrial Inspection XV
Fabrice Meriaudeau; Kurt S. Niel, Editor(s)

© SPIE. Terms of Use
Back to Top