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Proceedings Paper

Xtreme optics: the behavior of cavity optics for the Jefferson Lab Free-Electron Laser
Author(s): Michelle Shinn; Christopher Behre; Stephen Benson; David Douglas; Fred Dylla; Christopher Gould; Joseph Gubeli; David Hardy; Kevin Jordan; George Neil; Shukui Zhang
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Paper Abstract

The cavity optics within high power free-electron lasers based on energy-recovering accelerators are subjected to extreme conditions associated with illumination from a broad spectrum of radiation, often at high irradiances. This is especially true for the output coupler, where absorption of radiation by both the mirror substrate and coating places significant design restrictions to properly manage heat load and prevent mirror distortion. Besides the fundamental lasing wavelength, the mirrors are irradiated with light at harmonics of the fundamental, THz radiation generated by the bending magnets downstream of the wiggler, and x-rays produced when the electron beam strikes accelerator diagnostic components (e.g., wire scanners and view screens) or from inadvertent beam loss. The optics must reside within high vacuum at ~ 10-8 Torr and this requirement introduces its own set of complications. This talk discusses the performance of numerous high reflector and output coupler optics assemblies and provides a detailed list of lessons learned gleaned from years of experience operating the Upgrade IR FEL, a 10 kW-class, sub-ps laser with output wavelength from 1 to 6 microns.

Paper Details

Date Published: 15 January 2007
PDF: 7 pages
Proc. SPIE 6403, Laser-Induced Damage in Optical Materials: 2006, 64030Y (15 January 2007); doi: 10.1117/12.696816
Show Author Affiliations
Michelle Shinn, Thomas Jefferson National Accelerator Facility (United States)
Christopher Behre, Naval Surface Warfare Ctr. (United States)
Stephen Benson, Thomas Jefferson National Accelerator Facility (United States)
David Douglas, Thomas Jefferson National Accelerator Facility (United States)
Fred Dylla, Thomas Jefferson National Accelerator Facility (United States)
Christopher Gould, Thomas Jefferson National Accelerator Facility (United States)
Joseph Gubeli, Thomas Jefferson National Accelerator Facility (United States)
David Hardy, Thomas Jefferson National Accelerator Facility (United States)
Kevin Jordan, Thomas Jefferson National Accelerator Facility (United States)
George Neil, Thomas Jefferson National Accelerator Facility (United States)
Shukui Zhang, Thomas Jefferson National Accelerator Facility (United States)


Published in SPIE Proceedings Vol. 6403:
Laser-Induced Damage in Optical Materials: 2006
Gregory J. Exarhos; Arthur H. Guenther; Keith L. Lewis; Detlev Ristau; M. J. Soileau; Christopher J. Stolz, Editor(s)

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