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Proceedings Paper

Latest developments in micro-optical artificial compound eyes: a promising approach for next generation ultracompact machine vision
Author(s): Jacques Duparré; Daniela Radtke; Andreas Brückner; Andreas Bräuer
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Paper Abstract

The visual revolution triggered by the commercial application of digital image capturing devices generates the need for new miniaturized and cheap optical imaging systems and cameras. However, in imaging we observe a permanent miniaturization of elements but always similar optical principles are applied which have been known to the optical designers for many decades. With the newly gained spectrum of technological capabilities in micro- optics such as photolithography it is time to exploit completely new imaging principles such as for instance the microlens array imaging. In this paper we present an overview of our latest developments on: the technology and image processing of the artificial apposition compound eye, a rotating artificial apposition compound eye column for panoramic vision, an artificial apposition compound eye on a curved basis and an ultra-short, large object-size microscope. All the systems have a total track of below or only a few mm in common, while at the same time having an optical performance comparable to that of the conventional exemplars, e.g. a resolution of 50LP/mm over a field of 4.5mm for the large object-size microscope.

Paper Details

Date Published: 17 February 2007
PDF: 12 pages
Proc. SPIE 6503, Machine Vision Applications in Industrial Inspection XV, 65030I (17 February 2007); doi: 10.1117/12.696255
Show Author Affiliations
Jacques Duparré, Fraunhofer Institute for Applied Optics and Precision Engineering (Germany)
Daniela Radtke, Fraunhofer Institute for Applied Optics and Precision Engineering (Germany)
Andreas Brückner, Fraunhofer Institute for Applied Optics and Precision Engineering (Germany)
Andreas Bräuer, Fraunhofer Institute for Applied Optics and Precision Engineering (Germany)


Published in SPIE Proceedings Vol. 6503:
Machine Vision Applications in Industrial Inspection XV
Fabrice Meriaudeau; Kurt S. Niel, Editor(s)

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