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Proceedings Paper

Results of sub-nanosecond laser-conditioning of KD2PO4 crystals
Author(s): J. J. Adams; J. A. Jarboe; C. W. Carr; M. D. Feit; R. P. Hackel; J. M. Halpin; J. Honig; L. A. Lane; R. L. Luthi; J. E. Peterson; D. L. Ravizza; F. L. Ravizza; A. M. Rubenchik; W. D. Sell; J. L. Vickers; T. L. Weiland; T. J. Wennberg; D. A. Willard; M. F. Yeoman
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Paper Abstract

Previous work [1] has shown the optimum pulse length range for laser-conditioning tripler-cut DKDP with 355 nm (3ω) light lies between 200 ps and 900 ps for damage initiated at 3 ns. A 3ω, 500 ps (500 ps) table-top laser system has been built at Lawrence Livermore National Laboratory (LLNL) [2] to take advantage of this optimal conditioning pulse length range. This study evaluates parameters important for practically utilizing this laser as a raster-scan conditioning laser and for determining the effectiveness of various conditioning protocols. Damage density vs. test fluence (ρ(Φ) was measured for unconditioned and 500-ps laser-conditioned (conditioned) DKDP with 3ω, 3 ns (3 ns) test pulses. We find a 2.5X improvement in fluence in the 3 ns ρ(Φ) after conditioning with 500 ps pulses to 5 J/cm2. We further determine that the rate of improvement in ρ(Φ)decreases at the higher conditioning fluences (i.e. 3.5 - 5 J/cm2). Single-shot damage threshold experiments at 500 ps were used to determine the starting fluence for our 500 ps conditioning ramps. We find 0%, 70%, and 100% single-shot damage probability fluences of 4, 4.5, and 5 J/cm2, respectively at 500 ps. Bulk damage size distributions created at 3 ns are presented for unconditioned and conditioned DKDP. The range of diameters of bulk damage sites (pinpoints) in unconditioned DKDP is found to be 4.6 ± 4.4 µm in agreement with previous results. Also, we observe no apparent difference in the bulk damage size distributions between unconditioned and conditioned DKDP for testing at 3 ns.

Paper Details

Date Published: 15 January 2007
PDF: 14 pages
Proc. SPIE 6403, Laser-Induced Damage in Optical Materials: 2006, 64031M (15 January 2007); doi: 10.1117/12.696086
Show Author Affiliations
J. J. Adams, Lawrence Livermore National Lab. (United States)
J. A. Jarboe, Lawrence Livermore National Lab. (United States)
C. W. Carr, Lawrence Livermore National Lab. (United States)
M. D. Feit, Lawrence Livermore National Lab. (United States)
R. P. Hackel, Lawrence Livermore National Lab. (United States)
J. M. Halpin, Lawrence Livermore National Lab. (United States)
J. Honig, Lawrence Livermore National Lab. (United States)
L. A. Lane, Lawrence Livermore National Lab. (United States)
R. L. Luthi, Lawrence Livermore National Lab. (United States)
J. E. Peterson, Lawrence Livermore National Lab. (United States)
D. L. Ravizza, Lawrence Livermore National Lab. (United States)
F. L. Ravizza, Lawrence Livermore National Lab. (United States)
A. M. Rubenchik, Lawrence Livermore National Lab. (United States)
W. D. Sell, Lawrence Livermore National Lab. (United States)
J. L. Vickers, Lawrence Livermore National Lab. (United States)
T. L. Weiland, Lawrence Livermore National Lab. (United States)
T. J. Wennberg, Lawrence Livermore National Lab. (United States)
D. A. Willard, Lawrence Livermore National Lab. (United States)
M. F. Yeoman, Lawrence Livermore National Lab. (United States)


Published in SPIE Proceedings Vol. 6403:
Laser-Induced Damage in Optical Materials: 2006
Gregory J. Exarhos; Arthur H. Guenther; Keith L. Lewis; Detlev Ristau; M. J. Soileau; Christopher J. Stolz, Editor(s)

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