Share Email Print
cover

Proceedings Paper

A year of automated LDT testing on ion beam sputtered thin film optics and laser conditioning of IBS films
Author(s): Dale C. Ness; Thomas Bittancourt; Alan D. Streater
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The automated laser damage testing system at REO has been in operation for over a year, providing quantitative and detailed information on laser damage of ion beam sputtered (IBS) thin films in a production setting. Results have accumulated in a database, which can be queried in complex ways. We present statistical analysis on event curves (number vs. fluence) for various defect size groups. We examine the differences in event curves for high-threshold and lower-threshold IBS optics. We also present results of experiments on laser conditioning of IBS thin films.

Paper Details

Date Published: 15 January 2007
PDF: 13 pages
Proc. SPIE 6403, Laser-Induced Damage in Optical Materials: 2006, 640327 (15 January 2007); doi: 10.1117/12.696020
Show Author Affiliations
Dale C. Ness, Research Electro-Optics, Inc. (United States)
Thomas Bittancourt, Research Electro-Optics, Inc. (United States)
Alan D. Streater, Research Electro-Optics, Inc. (United States)


Published in SPIE Proceedings Vol. 6403:
Laser-Induced Damage in Optical Materials: 2006
Gregory J. Exarhos; Arthur H. Guenther; Keith L. Lewis; Detlev Ristau; M. J. Soileau; Christopher J. Stolz, Editor(s)

© SPIE. Terms of Use
Back to Top