Share Email Print
cover

Proceedings Paper

NIMO: a new tool for asphere and free-form optics measurement
Author(s): Luc Joannes; Marie Heraud; Renaud Ligot; Bruno Saoul; Olivier Dupont
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

NIMO is a new measurement tool based on the Phase-Shifting Schlieren technique [1]. The technique combines the Schlieren principle with the phase-shifting technique generally used in interferometry. By an adequate Schlieren filter and an adapted set-up, some Schlieren Fringes coding light beam deviation angles are generated. After the application of the phase shift technique, the Schlieren phase is calculated and converted in beam deviation values. The technique has been validated on conventional optical element ranging from millimetre to decimetre scales. NIMO opens a new step in metrology in a wide industrial range in both reflection and transmission (e.g. optical manufacturing, glass industry, ophthalmic industry,...). In [2],we focused on fluid physics applications and the implementation of the technique in a microscope for MEMS measurements. In [3], we described an adapted setup in which all the phase shifted images are acquired simultaneously opening the possibility to measure dynamic phenomena with NIMO. This paper is focused on the instrument recently developed for ophthalmic industry. The performances of the instrument are given and industrial applications in free-form and aspherical surfaces metrology are demonstrated.

Paper Details

Date Published: 15 September 2006
PDF: 7 pages
Proc. SPIE 6341, Speckle06: Speckles, From Grains to Flowers, 634134 (15 September 2006); doi: 10.1117/12.696006
Show Author Affiliations
Luc Joannes, Lambda-X (Belgium)
Marie Heraud, Lambda-X (Belgium)
Renaud Ligot, Lambda-X (Belgium)
Bruno Saoul, Lambda-X (Belgium)
Olivier Dupont, Lambda-X (Belgium)


Published in SPIE Proceedings Vol. 6341:
Speckle06: Speckles, From Grains to Flowers
Pierre Slangen; Christine Cerruti, Editor(s)

© SPIE. Terms of Use
Back to Top