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Proceedings Paper

Optical full-field measurement of strain at a microscopic scale with the grid method
Author(s): Raphaël Moulart; René Rotinat; Fabrice Pierron; Gilles Lerondel; Pascal Royer
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Paper Abstract

In this work, a new micro-extensometric technique to study the local heterogeneities of strain fields in metallic alloys is introduced. It is based on the optical full-field measurement method called the grid method adapted to the micrometric scale. In the first part of the paper, the making of a periodic grating at the surface of the sample by direct interferometric photolithography is explained. The optimization of the grids in terms of phase noise is then addressed.

Paper Details

Date Published: 15 September 2006
PDF: 6 pages
Proc. SPIE 6341, Speckle06: Speckles, From Grains to Flowers, 63412U (15 September 2006); doi: 10.1117/12.695991
Show Author Affiliations
Raphaël Moulart, Lab. de Mécanique et Procédés de Fabrication, ENSAM (France)
René Rotinat, Lab. de Mécanique et Procédés de Fabrication, ENSAM (France)
Fabrice Pierron, Lab. de Mécanique et Procédés de Fabrication, ENSAM (France)
Gilles Lerondel, Institut Charles Delaunay, Univ. de Technologie de Troyes, CNRS (France)
Pascal Royer, Institut Charles Delaunay, Univ. de Technologie de Troyes, CNRS (France)


Published in SPIE Proceedings Vol. 6341:
Speckle06: Speckles, From Grains to Flowers
Pierre Slangen; Christine Cerruti, Editor(s)

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