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Proceedings Paper

Influence of the laser beam size on laser-induced damage in KH2PO4
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Paper Abstract

For large aperture solid state lasers, the laser resistance of the optical component remains an important limitation for the performances and the maintenance costs. Since decades, laser induced damage has been intensively studied in order to understand and control the origin of the phenomenon. LID measurements are commonly performed with table top lasers whose characteristics change from one to another and, sometimes, the scaling laws do not permit to explain the experimental differences. For example, we have previously demonstrated that, in KH2PO4 (KDP) crystals, the laser beam size can influence strongly the determination of the damage probability. Here, we present a systematic study realized on KDP crystal to quantify the influence of the beam size on the LIDT (Laser Induced Damage Threshold) measurement at 355 nm. The use of an unique Gaussian beam ranged from micronic to sub-millimetric sizes permits to highlight different types of laser-damage precursor. LIDT measurements realized with beams of small (lower than 100 microns at 1/e2)or large (upper than 400 microns at 1/e2)dimensions give information about the behavior of material regarding precursor defects.

Paper Details

Date Published: 18 January 2007
PDF: 6 pages
Proc. SPIE 6403, Laser-Induced Damage in Optical Materials: 2006, 64031R (18 January 2007); doi: 10.1117/12.695445
Show Author Affiliations
J. Capoulade, Institut Fresnel, CNRS 6133, Univ. de Provence (France)
Univ. Paul Cézanne (France)
J. Y. Natoli, Institut Fresnel, CNRS 6133, Univ. de Provence (France)
Univ. Paul Cézanne (France)
B. Bertussi, CEA Le Ripault (France)
M. Pommies, CEA Le Ripault (France)
A. Dyan, CEA Le Ripault (France)
D. Damiani, CEA Le Ripault (France)
H. Piombini, CEA Le Ripault (France)


Published in SPIE Proceedings Vol. 6403:
Laser-Induced Damage in Optical Materials: 2006
Gregory J. Exarhos; Arthur H. Guenther; Keith L. Lewis; Detlev Ristau; M. J. Soileau; Christopher J. Stolz, Editor(s)

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