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Proceedings Paper

Systematic error compensation in electronic speckle pattern shearing interferometry
Author(s): R. Rodríguez-Vera; R. R. Cordero; F. Labbe; J. A. Rayas; Amalia Martínez; F. Mendoza-Santoyo
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Paper Abstract

Electronic speckle pattern shearing interferometry (ESPSI), also known as digital shearography, is a hole-field non-destructive, optical technique used to measure approximately the field of displacement derivatives. The accurate measurements of these derivatives have several problems one of them is that of ESPSI results are approximately equal to the derivatives, they are equal to the derivatives only if the shear distance tends to zero, hence, if experimental data rendered by ESPSI are taken directly as equal to the derivatives, the measurements may carry an important shearing error. Other error, ESPSI yields values relative to a reference value at a specific location of the field that can be very difficult to determine accurately. In this paper, we propose a general procedure to compensate the shearing error and to introduce the reference by adding two quantities to the values rendered by ESPSI. As an example, we measured a displacement derivative field induced on a metallic sheet specimen by applying tensile load.

Paper Details

Date Published: 15 September 2006
PDF: 6 pages
Proc. SPIE 6341, Speckle06: Speckles, From Grains to Flowers, 63411J (15 September 2006); doi: 10.1117/12.695375
Show Author Affiliations
R. Rodríguez-Vera, Ctr. de Investigaciones en Óptica (Mexico)
R. R. Cordero, Ctr. de Investigaciones en Óptica (Mexico)
F. Labbe, Univ. Técnica Federico Santa Maria (Chile)
J. A. Rayas, Univ. Técnica Federico Santa Maria (Chile)
Amalia Martínez, Ctr. de Investigaciones en Óptica (Mexico)
F. Mendoza-Santoyo, Ctr. de Investigaciones en Óptica (Mexico)


Published in SPIE Proceedings Vol. 6341:
Speckle06: Speckles, From Grains to Flowers
Pierre Slangen; Christine Cerruti, Editor(s)

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