Share Email Print

Proceedings Paper

New techniques for detecting and monitoring corrosion using nanostructures
Author(s): Christopher O. Muller; William G. England
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Many metal containing devices and structures must function in corrosive atmospheres that can cause them to deteriorate over time. Corrosion may take the form of metal oxides or may be compounds formed by exposure to the effluent of industrial manufacturing processes. The electronic process measurement and control industry estimates that approximately one-third of all warranty repair work can be attributable to corrosion. Accordingly, the ability to accurately monitor corrosion and take appropriate measures to avoid, deter, or prevent it can be of utmost importance to the industry. One method and apparatus for monitoring corrosion utilizes a piezoelectric crystal as a corrosion monitor. The crystal is coated with one of several corrodible metals, and the coated crystal is attached to an oscillator before placement in a potentially corrosive atmosphere. As the metal corrodes, the frequency of vibration of the coated crystal decreases. The frequency reading is then converted to a corresponding corrosion film thickness. This monitoring method and apparatus are generally suitable for measuring and detecting certain degrees of corrosion, however, in some instances more precise measurements of corrosion are desired. This paper will describe a corrosion monitor based on a microcantilever device coated with a reactive metal. Information will be provided on the development of a working microcantilever-based corrosion sensor.

Paper Details

Date Published: 19 January 2007
PDF: 11 pages
Proc. SPIE 6463, Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS VI, 646303 (19 January 2007); doi: 10.1117/12.695221
Show Author Affiliations
Christopher O. Muller, Purafil, Inc. (United States)
William G. England, Purafil, Inc. (United States)

Published in SPIE Proceedings Vol. 6463:
Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS VI
Allyson L. Hartzell; Rajeshuni Ramesham, Editor(s)

© SPIE. Terms of Use
Back to Top