Share Email Print
cover

Proceedings Paper

Imaging-based logics for ornamental stone quality chart definition
Author(s): Giuseppe Bonifazi; Aldo Gargiulo; Silvia Serranti; Costantino Raspi
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

Ornamental stone products are commercially classified on the market according to several factors related both to intrinsic lythologic characteristics and to their visible pictorial attributes. Sometimes these latter aspects prevail in quality criteria definition and assessment. Pictorial attributes are in any case also influenced by the performed working actions and the utilized tools selected to realize the final stone manufactured product. Stone surface finishing is a critical task because it can contribute to enhance certain aesthetic features of the stone itself. The study was addressed to develop an innovative set of methodologies and techniques able to quantify the aesthetic quality level of stone products taking into account both the physical and the aesthetical characteristics of the stones. In particular, the degree of polishing of the stone surfaces and the presence of defects have been evaluated, applying digital image processing strategies. Morphological and color parameters have been extracted developing specific software architectures. Results showed as the proposed approaches allow to quantify the degree of polishing and to identify surface defects related to the intrinsic characteristics of the stone and/or the performed working actions.

Paper Details

Date Published: 20 February 2007
PDF: 10 pages
Proc. SPIE 6503, Machine Vision Applications in Industrial Inspection XV, 65030P (20 February 2007); doi: 10.1117/12.694879
Show Author Affiliations
Giuseppe Bonifazi, Univ. di Roma La Sapienza (Italy)
Aldo Gargiulo, Univ. di Roma La Sapienza (Italy)
Silvia Serranti, Univ. di Roma La Sapienza (Italy)
Costantino Raspi, C.G.S. di Coluccia Michele&C. sas (Italy)


Published in SPIE Proceedings Vol. 6503:
Machine Vision Applications in Industrial Inspection XV
Fabrice Meriaudeau; Kurt S. Niel, Editor(s)

© SPIE. Terms of Use
Back to Top