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Proceedings Paper

Structural studies of SnS films prepared by thermal evaporation
Author(s): Shuying Cheng; Cichang Huang; Guonan Chen; G. J. Conibeer
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Paper Abstract

Tin sulphide films with thickness of 500~1000 nm were deposited on ITO glass substrates at 30~150°C by a thermal evaporation technique. The films were characterized with X-ray diffraction (XRD), scanning electron microscopy (SEM) and atomic force microscopy (AFM) analysis. The vibrational property of the films was examined by Raman spectra. The SnS films are polycrystalline with a strong {111} preferred orientation, and they have orthorhombic crystal structure with a grain size of a few ten nanometers and exhibited near stoichiometric SnS composition. Their lattice parameters are a=0.4309~0.4313 nm, b=1.1263~1.1273 nm, c=0.3981~0.3990 nm which closely resembles those of bulk SnS at room temperature. And the substrate temperature has some influence on the composition and structure of the deposited films: when the substrate temperature increases from 30°C to 150°C, the grains in the films become smaller and the crystallinity has been improved. sulphide films with thickness of 500~1000 nm were deposited on ITO glass substrates at 30~150°C by a thermal evaporation technique. The films were characterized with X-ray diffraction (XRD), scanning electron microscopy (SEM) and atomic force microscopy (AFM) analysis. The vibrational property of the films was examined by Raman spectra. The SnS films are polycrystalline with a strong {111} preferred orientation, and they have orthorhombic crystal structure with a grain size of a few ten nanometers and exhibited near stoichiometric SnS composition. Their lattice parameters are a=0.4309~0.4313 nm, b=1.1263~1.1273 nm, c=0.39810~.3990 nm which closely resembles those of bulk SnS at room temperature. And the substrate temperature has some influence on the composition and structure of the deposited films: when the substrate temperature increases from 30°C to 150°C, the grains in the films become smaller and the crystallinity has been improved.

Paper Details

Date Published: 20 December 2006
PDF: 8 pages
Proc. SPIE 6415, Micro- and Nanotechnology: Materials, Processes, Packaging, and Systems III, 641512 (20 December 2006); doi: 10.1117/12.694343
Show Author Affiliations
Shuying Cheng, Fuzhou Univ. (China)
Cichang Huang, Fuzhou Univ. (China)
Guonan Chen, Fuzhou Univ. (China)
G. J. Conibeer, Univ. of New South Wales (Australia)


Published in SPIE Proceedings Vol. 6415:
Micro- and Nanotechnology: Materials, Processes, Packaging, and Systems III
Jung-Chih Chiao; Andrew S. Dzurak; Chennupati Jagadish; David Victor Thiel, Editor(s)

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