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Proceedings Paper

Estimating wheat yield: an approach for estimating number of grains using cross-polarised ENVISAT-1 ASAR data
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Paper Abstract

In this paper an attempt to model wheat yield is made by exploiting characteristic interaction of cross-polarised SAR with wheat crop. SAR backscatter from a crop field is affected by the density, structure, volume and the moisture content of various components of plant (viz. head, stem, leaf) alongwith soil moisture. Hence, to effectively handle the influence of each of these components of the plant on SAR backscatter, a plant parameter, termed as Interaction Factor (IF) is conceptualised by combining volume, moisture, height for each of the component and density of plant. For this purpose, detailed experiment over farmers' fields was carried out in synchrony with SAR acquisition involving in-depth measurements on volume, moisture content and height of various components of wheat plant, number of grains, plant density and soil moisture. Stepwise regression analysis revealed that IFHead significantly affects the shallow incidence angle, cross-polarised C-band SAR backscatter. IFHead is also highly correlated to the number of grains. This is attributed to the fact that parameters of the wheat head from which IFHead is calculated, namely moisture, volume and height, determine eventual number of grains. The study offers an approach for estimating wheat yield by retrieving number of grains from shallow incidence angle cross-polarised SAR data.

Paper Details

Date Published: 7 December 2006
PDF: 12 pages
Proc. SPIE 6410, Microwave Remote Sensing of the Atmosphere and Environment V, 641009 (7 December 2006); doi: 10.1117/12.693930
Show Author Affiliations
Parul Patel, ISRO Space Applications Ctr. (India)
Hari Shanker Srivastava, ISRO Regional Remote Sensing Service Ctr. (India)
Ranganath R. Navalgund, ISRO Space Applications Ctr. (India)

Published in SPIE Proceedings Vol. 6410:
Microwave Remote Sensing of the Atmosphere and Environment V
Azita Valinia; Seiho Uratsuka; Tapan Misra, Editor(s)

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