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Proceedings Paper

Research on a solid state-streak camera based on an electro-optic crystal
Author(s): Chen Wang; Baiyu Liu; Yonglin Bai; Xiaohong Bai; Jinshou Tian; Wenzheng Yang; Ouyang Xian
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Paper Abstract

With excellent temporal resolution ranging from nanosecond to sub-picoseconds, a streak camera is widely utilized in measuring ultrafast light phenomena, such as detecting synchrotron radiation, examining inertial confinement fusion target, and making measurements of laser-induced discharge. In combination with appropriate optics or spectroscope, the streak camera delivers intensity vs. position (or wavelength) information on the ultrafast process. The current streak camera is based on a sweep electric pulse and an image converting tube with a wavelength-sensitive photocathode ranging from the x-ray to near infrared region. This kind of streak camera is comparatively costly and complex. This paper describes the design and performance of a new-style streak camera based on an electro-optic crystal with large electro-optic coefficient. Crystal streak camera accomplishes the goal of time resolution by direct photon beam deflection using the electro-optic effect which can replace the current streak camera from the visible to near infrared region. After computer-aided simulation, we design a crystal streak camera which has the potential of time resolution between 1ns and 10ns.Some further improvements in sweep electric circuits, a crystal with a larger electro-optic coefficient, for example LN (γ33=33.6×10-12m/v) and the optimal optic system may lead to better time resolution less than 1ns.

Paper Details

Date Published: 10 June 2006
PDF: 6 pages
Proc. SPIE 6344, Advanced Laser Technologies 2005, 63440B (10 June 2006); doi: 10.1117/12.693428
Show Author Affiliations
Chen Wang, Xi'an Institute of Optics and Precision Mechanics (China)
Baiyu Liu, Xi'an Institute of Optics and Precision Mechanics (China)
Yonglin Bai, Xi'an Institute of Optics and Precision Mechanics (China)
Xiaohong Bai, Xi'an Institute of Optics and Precision Mechanics (China)
Jinshou Tian, Xi'an Institute of Optics and Precision Mechanics (China)
Wenzheng Yang, Xi'an Institute of Optics and Precision Mechanics (China)
Ouyang Xian, Xi'an Institute of Optics and Precision Mechanics (China)


Published in SPIE Proceedings Vol. 6344:
Advanced Laser Technologies 2005

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