Share Email Print
cover

Proceedings Paper

About the possibility of interval identification of functional dependences at research of semiconductor materials in a cathodoluminescent microscopy
Author(s): Yu. E. Gagarin; V. A. Khomutski; A. V. Snachev; Yu. V. Dvoryanchikova; M. A. Stepovich
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

Opportunities of reception of interval estimations of the functional dependence connecting the intensity of monochromatic cathodoluminescence with electron beam energies are considered at the account of casual character of the initial information. The account of casual character of the initial information is carried out with use of the confluence analysis. The methods of mathematical modeling receive interval estimations of functional dependences for directly zoned semiconductors.

Paper Details

Date Published: 31 May 2006
PDF: 6 pages
Proc. SPIE 6278, Seventh Seminar on Problems of Theoretical and Applied Electron and Ion Optics, 62780N (31 May 2006); doi: 10.1117/12.693209
Show Author Affiliations
Yu. E. Gagarin, Bauman Moscow State Technical Univ. (Russia)
V. A. Khomutski, Kaluga Tsiolkovski State Pedagogical Univ. (Russia)
A. V. Snachev, Kaluga Tsiolkovski State Pedagogical Univ. (Russia)
Yu. V. Dvoryanchikova, Kaluga Tsiolkovski State Pedagogical Univ. (Russia)
M. A. Stepovich, Kaluga Tsiolkovski State Pedagogical Univ. (Russia)


Published in SPIE Proceedings Vol. 6278:
Seventh Seminar on Problems of Theoretical and Applied Electron and Ion Optics
Anatoly M. Filachev, Editor(s)

© SPIE. Terms of Use
Back to Top