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Proceedings Paper

High speed multipoint vibrometer for modal analysis
Author(s): S. Earl; T. Wu; J. D. C. Jones; A. J. Moore
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Paper Abstract

The use of a digital speckle pattern interferometer (SPI) based on a complementary metal-oxide semiconductor (CMOS) camera for vibration measurement is described. The flexibility of the CMOS detector enables regions of interest (ROIs) to be identified with full-field time-averaged measurements, and then to interrogate those regions with time-resolved measurements sampled at up to 70 kHz. The system effectively acts as a non-contact optical vibrometer that can measure surface velocity at several points simultaneously. The CMOS detector allows measurement of the vibration frequency, amplitude and relative phase between ROIs with high spatial and temporal resolution. The multi-point vibrometer was used to collect velocity information of a centre clamped circular plate that is subjected to transient excitation. The information is processed to determine the natural frequency mode shapes from velocity data for the first time.

Paper Details

Date Published: 21 June 2006
PDF: 7 pages
Proc. SPIE 6345, Seventh International Conference on Vibration Measurements by Laser Techniques: Advances and Applications, 634512 (21 June 2006); doi: 10.1117/12.693152
Show Author Affiliations
S. Earl, Heriot-Watt Univ. (United Kingdom)
T. Wu, Heriot-Watt Univ. (United Kingdom)
J. D. C. Jones, Heriot-Watt Univ. (United Kingdom)
A. J. Moore, Heriot-Watt Univ. (United Kingdom)


Published in SPIE Proceedings Vol. 6345:
Seventh International Conference on Vibration Measurements by Laser Techniques: Advances and Applications

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