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Proceedings Paper

The application of direct integral-geometric methods for interferometric image analysis
Author(s): A. A. Aliverdiev; C. Moriconi; M. A. Caponero; E. Bacchi; P. A. Fichera; G. Sagratella
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Paper Abstract

Here we present our approach to apply the direct Radon transform for the analysis of interferometric images, in particular for the laser speckle velocymetry, and for the ESPI measurements. A technique for the precise velocity measurement is based on the precise calculation of the common movement of a laser speckle field. This approach allows realising a velocimeter suitable for use in extreme conditions. The latest results of our investigations are presented in this report. We also present the method of image analysis for the automatic set up of an Electronic Speckle Pattern Interferometry (ESPI). The idea of our method is to make a direct Radon-like transformation for each pixel (x0, y0) a 2D field of an image brightness B(x,y):, and than we calculate the rms spatial deviation by s, the maximum of which determines two values: (i) immediate maxφs), and (ii) the corresponded angle φ((σs)max). So, from 2D function B(x,y) we have two functions depended from same 2D field, but gives a clear defect location. Our investigations show a perspective of our approach. The submitted results have both methodological and applied significance for the pattern analysis.

Paper Details

Date Published: 21 June 2006
PDF: 8 pages
Proc. SPIE 6345, Seventh International Conference on Vibration Measurements by Laser Techniques: Advances and Applications, 63450A (21 June 2006); doi: 10.1117/12.693111
Show Author Affiliations
A. A. Aliverdiev, Institute of Physics (Russia)
International Humanitarian and Technical Academy (Russia)
C. Moriconi, ENEA (Italy)
M. A. Caponero, ENEA (Italy)
E. Bacchi, ENEA (Italy)
P. A. Fichera, ENEA (Italy)
G. Sagratella, ENEA (Italy)


Published in SPIE Proceedings Vol. 6345:
Seventh International Conference on Vibration Measurements by Laser Techniques: Advances and Applications
Enrico Primo Tomasini, Editor(s)

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