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Proceedings Paper

Two-frequency analysis of fiber-optic structures
Author(s): Oleg G. Morozov; Oleg G. Natanson; Dmitry L. Aibatov; German I. Ilyin; Eugeniya A. Kalatcheva
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Paper Abstract

The paper analyses present reflectometry systems for their application in optical fiber structures monitoring. The method of optical reflectometry for OFS monitoring in two frequency domain (OTFDR) is considered. Systems on the base of two-frequency probing for studying Raman and Brillouin scattering and parameters of FBGs are proposed. Questions of OTFDR application efficiency for these applications are discussed.

Paper Details

Date Published: 30 May 2006
PDF: 11 pages
Proc. SPIE 6277, Optical Technologies for Telecommunications 2005, 62770E (30 May 2006); doi: 10.1117/12.692970
Show Author Affiliations
Oleg G. Morozov, Kazan State Technical Univ. (Russia)
International Telecommunication Academy (Russia)
Oleg G. Natanson, JSC Tattelecom (Russia)
International Telecommunication Academy (Russia)
Dmitry L. Aibatov, Kazan State Technical Univ. (Russia)
German I. Ilyin, Kazan State Technical Univ. (Russia)
Eugeniya A. Kalatcheva, Kazan State Technical Univ. (Russia)


Published in SPIE Proceedings Vol. 6277:
Optical Technologies for Telecommunications 2005
Vladimir A. Andreev; Vladimir A. Burdin; Albert H. Sultanov, Editor(s)

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