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Proceedings Paper

High-precision measurements of reflectance
Author(s): Philippe Voarino; Sébastien Petitrenaud; Hervé Piombini; Frédéric Sabary; Daniel Marteau
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Paper Abstract

The reflector's specifications of amplifying section of LMJ need to have spectral high-precision reflectance measurements. The innovative solution proposes to increase the precision of reflectance measurements, and to enable measure of pieces in form like spherical mirrors. This activity has been beginning for months and improvements have been performed.

Paper Details

Date Published: 13 July 2006
PDF: 8 pages
Proc. SPIE 6342, International Optical Design Conference 2006, 63421Z (13 July 2006); doi: 10.1117/12.692235
Show Author Affiliations
Philippe Voarino, CEA Le Ripault (France)
Sébastien Petitrenaud, CEA Le Ripault (France)
Hervé Piombini, CEA Le Ripault (France)
Frédéric Sabary, CEA Le Ripault (France)
Daniel Marteau, CEA Le Ripault (France)


Published in SPIE Proceedings Vol. 6342:
International Optical Design Conference 2006
G. Groot Gregory; Joseph M. Howard; R. John Koshel, Editor(s)

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