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Proceedings Paper

Design of an LWIR snapshot imaging spectropolarimeter
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Paper Abstract

This paper covers the design and construction of a snapshot imaging spectropolarimeter for use in the long wave infrared, 8 to 12 micron region. This imaging device is unique in the fact that system is nonscanning, contains no moving parts, and in a single integration period is able to record spectral data as well as the polarization state as a function of wavelength from every spatial location in a 2D image. The system is based on the Computed Tomographic Imaging Spectrometer, commonly referred to as CTIS, and has been modified to incorporate components of Channeled Spectropolarimetry. The paper presents an overview of how both the CTIS and the CTICS (Computed Tomographic Imaging Channeled Spectropolarimeter) systems work, details on the specific components used in the LWIR system, and preliminary results from a completed LWIR CTIS system, which is the first of its kind.

Paper Details

Date Published: 8 September 2006
PDF: 9 pages
Proc. SPIE 6295, Infrared Detectors and Focal Plane Arrays VIII, 62950E (8 September 2006); doi: 10.1117/12.688404
Show Author Affiliations
Riley W. Aumiller, College of Optical Sciences/Univ. of Arizona (United States)
Nathan A. Hagen, College of Optical Sciences/Univ. of Arizona (United States)
Eustace L. Dereniak, College of Optical Sciences/Univ. of Arizona (United States)
Robert Sampson, I Technology Applications (United States)
Robert W. McMillan, U.S. Army Space and Missile Defense Command (United States)


Published in SPIE Proceedings Vol. 6295:
Infrared Detectors and Focal Plane Arrays VIII
Eustace L. Dereniak; Robert E. Sampson, Editor(s)

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