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Proceedings Paper

The testing of responding time delay of the hybrid integrated circuit of PIN photodiode
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Paper Abstract

The responding time delay characteristic of the detector of PIN photodiode is caused by the different intensity of the signal received by the detector. The responding time delay usually is less several tens nano-seconds. Aaccording to the principle of the responding time delay, the testing system is designed to measure the responding time delay. The test of responding time delay with different laser powers is carried on, and the result of the responding time delays is given.

Paper Details

Date Published: 6 October 2006
PDF: 8 pages
Proc. SPIE 6352, Optoelectronic Materials and Devices, 63521R (6 October 2006); doi: 10.1117/12.687772
Show Author Affiliations
Rongguo Fu, Nanjing Univ. of Science & Technology (China)
Bengkang Chang, Nanjing Univ. of Science & Technology (China)
Yuansheng Qian, Nanjing Univ. of Science & Technology (China)
YaFeng Qiu, Nanjing Univ. of Science & Technology (China)


Published in SPIE Proceedings Vol. 6352:
Optoelectronic Materials and Devices
Yong Hee Lee; Fumio Koyama; Yi Luo, Editor(s)

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