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Proceedings Paper

Thorium dioxide thin films in the extreme ultraviolet
Author(s): Nicole F. Brimhall; Amy B. Grigg; R. Steven Turley; David D. Allred
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Paper Abstract

We have measured the reflectance and transmittance of thorium dioxide thin films from 50-280 eV. We have developed several methods for fitting this data that gives the most reliable values for the complex index of refraction, n = 1 - δ + iβ. These fitting methods included fitting film thickness using interference fringes in highly transmissive areas of the spectrum and fitting reflectance and transmittance data simultaneously. These techniques give more consistent optical constants than solitary unconstrained fitting of reflectance as a function of angle. Using these techniques, we have found approximate optical constants for thorium dioxide in this energy range. We found that the absorption edges of thoria were shifted 4 eV and 2 eV to lower energies from those of thorium. We also found that the peak in δ was shifted by 3 eV to lower energy from that of thorium.

Paper Details

Date Published: 29 August 2006
PDF: 12 pages
Proc. SPIE 6317, Advances in X-Ray/EUV Optics, Components, and Applications, 631710 (29 August 2006); doi: 10.1117/12.687201
Show Author Affiliations
Nicole F. Brimhall, Brigham Young Univ. (United States)
Amy B. Grigg, Brigham Young Univ. (United States)
R. Steven Turley, Brigham Young Univ. (United States)
David D. Allred, Brigham Young Univ. (United States)

Published in SPIE Proceedings Vol. 6317:
Advances in X-Ray/EUV Optics, Components, and Applications
Ali M. Khounsary; Christian Morawe, Editor(s)

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