Share Email Print
cover

Proceedings Paper

Multiresolution 3D measurement using a hybrid fringe projection and moire approach
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Projected fringe methods have lead to a wide selection of commercial sensors for 3D measurement applications. The basis of these systems is a projector such as an LCD presentation projector that is used to generate a coarse pattern that is shifted across the part and viewed by a camera. Three or more images with a small pattern shift between each are sufficient to obtain a detailed 3D map using phase shift analysis methods. The limitation of these systems has been that to obtain high resolution the system is limited to viewing only a small field-of-view. Moire methods are a way to leverage this resolution, particularly on flat or only slightly contoured areas. The approach described here takes advantage of moire methods used in connection with the fringe projection method to provide high resolution over key reference areas, while still provided a less precision measurement over a larger region.

Paper Details

Date Published: 12 October 2006
PDF: 8 pages
Proc. SPIE 6382, Two- and Three-Dimensional Methods for Inspection and Metrology IV, 63820K (12 October 2006); doi: 10.1117/12.687183
Show Author Affiliations
Kevin Harding, GE Global Research (United States)
Qingying Hu, GE Global Research (United States)


Published in SPIE Proceedings Vol. 6382:
Two- and Three-Dimensional Methods for Inspection and Metrology IV
Peisen S. Huang, Editor(s)

© SPIE. Terms of Use
Back to Top