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Proceedings Paper

The novel combined x-ray image intensifier and its imaging performance
Author(s): Chunyu Yu; Benkang Chang; Rongguo Fu; Xiao Yao
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Paper Abstract

The x-ray imaging technology has been improved greatly since Roentgen discovered x-ray in 1895 and it is very important in some fields such as medical treatment, nondestructive test and industrial detection. At present, there are many kinds of x-ray imaging technologies based on the different image detectors. To meet the requirement of real time observation, digital image processing and long-distance communication, digital radiography (DR) and direct digital radiography (DDR) are advantageous. The image intensifier is often used by large number of hospitals due to its affordable cost. As the key device of the x-ray imaging system, the conventional x-ray detector is mainly imported from Japan, or France because there is no domestic manufacture, which increases the cost of the whole x-ray imaging system, moreover the imported x-ray image intensifier has 9 inch visual field, thus limiting its application in some fields further. By combing the x-ray imaging technology and the low light level (L3) imaging technology, our research group designed the novel combined x-ray image intensifier, which means it is composed of the x-ray intensifying screen, zoom lens and the L3 image intensifier. In this paper, the principles on how to match the components of the x-ray image detector and how to design the structure of the x-ray image detector are introduced. At the end of the paper, the imaging performance of the x-ray image detector is given by showing the produced images and the MTF curve of the whole x-ray imaging system, which proved that the novel combined x-ray image intensifier is a good choice for many users and can be applied in many fields, such as the medical treatment, nondestructive test and industrial detection and even takes the place of the conventional x-ray image intensifier in some application fields.

Paper Details

Date Published: 6 October 2006
PDF: 8 pages
Proc. SPIE 6352, Optoelectronic Materials and Devices, 63522V (6 October 2006); doi: 10.1117/12.686832
Show Author Affiliations
Chunyu Yu, Nanjing Univ. of Science and Technology (China)
Benkang Chang, Nanjing Univ. of Science and Technology (China)
Rongguo Fu, Nanjing Univ. of Science and Technology (China)
Xiao Yao, Nanjing Univ. of Science and Technology (China)


Published in SPIE Proceedings Vol. 6352:
Optoelectronic Materials and Devices
Yong Hee Lee; Fumio Koyama; Yi Luo, Editor(s)

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