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Proceedings Paper

Multi-wavelength digital holographic metrology
Author(s): Carl C. Aleksoff
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Paper Abstract

A digital holographic metrology technique is described for measuring the three-dimensional shape of manufactured parts. The technique uses optical fibers to set up a near equal path interferometer, steps through multiple frequencies with a tunable laser, steps through multiple phases using a fiber based phase shifter, uses an off-axis parabolic mirror to collimate the light, and generates a digital hologram that leads to surface flatness measurements accuracies better than 1 micron over large surfaces. An example result for an automobile engine part is given using a Coherix Inc., ShapixTM 2000 instrument.

Paper Details

Date Published: 30 August 2006
PDF: 7 pages
Proc. SPIE 6311, Optical Information Systems IV, 63111D (30 August 2006); doi: 10.1117/12.686727
Show Author Affiliations
Carl C. Aleksoff, Coherix, Inc. (United States)


Published in SPIE Proceedings Vol. 6311:
Optical Information Systems IV
Bahram Javidi; Demetri Psaltis; H. John Caulfield, Editor(s)

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