Share Email Print

Proceedings Paper

A methodology for measurements of basic parameters in a xDSL system
Author(s): Edson Brito; Lamartine V. de Souza; Éder T. Patrício; Agostinho L. S. Castro; Gervásio P. dos S. Cavalcante; João Crisóstomo W. A. Costa; Klas Ericson; Fredrik Lindqvist; Jaume Rius I Riu
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

In order to qualify a subscriber loops for xDSL transmission, basic parameters like transfer function, scattering parameter S11 and characteristic impedance should be known. The aim of this paper is to present a test methodology for measurements of these basic parameters. The characteristic impedance is measured by open/short method and it is compared with the terminated measurement method defined in IEC (International Electrotechnical Commission) 611156-1. Transfer function and scattering parameter S11 of DSL loop are also measured on a real cable. The methodology is based on measurements of a 0.4 mm, 10 pairs, balanced twisted-pair cable of 1400 m of length. In order to improve the analysis of results, we compared the measurements from real cable with results from wireline simulators. The measurement of parameters of xDSL copper loop is done in an infrastructure set up in the LABIT (Technological Innovation in Telecommunications Lab) at UFPA (Federal University of Para), that consist of a wireline simulators, a precision impedance analyzer, and a network analyzer. The results show a difference between the measurements performed with real cables and wireline simulators for transfer function parameter. Characteristic impedance obtained by both methods presented quite similar results.

Paper Details

Date Published: 2 October 2006
PDF: 9 pages
Proc. SPIE 6390, Broadband Access Communication Technologies, 63900M (2 October 2006); doi: 10.1117/12.686685
Show Author Affiliations
Edson Brito, Federal Univ. of Para (Brazil)
Lamartine V. de Souza, Federal Univ. of Para (Brazil)
Éder T. Patrício, Federal Univ. of Para (Brazil)
Agostinho L. S. Castro, Federal Univ. of Para (Brazil)
Gervásio P. dos S. Cavalcante, Federal Univ. of Para (Brazil)
João Crisóstomo W. A. Costa, Federal Univ. of Para (Brazil)
Klas Ericson, Ericsson AB (Sweden)
Fredrik Lindqvist, Ericsson AB (Sweden)
Jaume Rius I Riu, Ericsson AB (Sweden)

Published in SPIE Proceedings Vol. 6390:
Broadband Access Communication Technologies
Raj Jain; Benjamin B. Dingel; Shozo Komaki; Shlomo Ovadia, Editor(s)

© SPIE. Terms of Use
Back to Top