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Proceedings Paper

Wavelet-based feature extraction method for inspection using cross-sensor image data
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Paper Abstract

We used a method designed to fuse imagery from different sensor types. The method uses different forward transforms of input images and a common transform to reconstruct the final result. When measuring the average relative entropy of the fused results, we found that our method gave generally better results when compared to a more conventional approach. We found that reconstruction filters with a small number of zeros seemed to give the best performance.

Paper Details

Date Published: 12 October 2006
PDF: 7 pages
Proc. SPIE 6383, Wavelet Applications in Industrial Processing IV, 63830F (12 October 2006); doi: 10.1117/12.686617
Show Author Affiliations
M. Ouendeno, Florida Institute of Technology (United States)
S. P. Kozaitis, Florida Institute of Technology (United States)


Published in SPIE Proceedings Vol. 6383:
Wavelet Applications in Industrial Processing IV
Frédéric Truchetet; Olivier Laligant, Editor(s)

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