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Proceedings Paper

Noncontact vibration analysis using innovative laser-based methodology
Author(s): Santiago Noriega; Devdas Shetty; Tom A. Eppes; Jun Kondo
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Paper Abstract

Vibration is a back and forth mechanical motion with a steady, uninterrupted rhythm about an equilibrium point. There are two types of vibration; natural (or free) and forced. Natural vibration occurs as the result of a disturbing force that is applied once and then removed. Forced vibration occurs as a result of a force applied repeatedly to a system. All machines have some amount of forced vibration. However, in some cases this vibration can cause damage to machinery. Understanding vibration is essential for any system that will be exposed to motion. Equipment such as strain gauges and piezoelectric accelerometers have been adequate in measuring vibration in the past; however, due to increased performance requirements and subsequent reductions in vibration, these methods are slowly being replaced by laserbased measurement systems. One reason for the slow transition is that part of the system in these methods must be mounted on the surface of the object being measured which can change the mass thus alter the frequency and mode shape of the vibrating object. At this time however, the high expenses to monitor precision vibration is a challenge, and there is a need for more cost-effective methods of vibration analysis. This paper outlines a lower cost laser-based method of measuring vibration with minimum surface contact.

Paper Details

Date Published: 19 October 2006
PDF: 11 pages
Proc. SPIE 6375, Optomechatronic Sensors, Instrumentation, and Computer-Vision Systems, 63750L (19 October 2006); doi: 10.1117/12.686273
Show Author Affiliations
Santiago Noriega, Univ. of Hartford (United States)
Devdas Shetty, Univ. of Hartford (United States)
Tom A. Eppes, Univ. of Hartford (United States)
Jun Kondo, Univ. of Hartford (United States)


Published in SPIE Proceedings Vol. 6375:
Optomechatronic Sensors, Instrumentation, and Computer-Vision Systems
Jonathan Kofman; Yasuhiro Takaya, Editor(s)

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