Share Email Print
cover

Proceedings Paper

Combined statistical-fractal wavelets signatures for texture recognition
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

When characterizing textures in the scope of recognition or segmentation, one can choose from a great number of existing features. Among them, features based on the wavelet decomposition provide good results and are already used in many applications. One key point for the success of these methods is the choice of the signature used to describe the sub-bands. The energy signature is the most popular, but others exist, with better efficiency. In this paper, we review some of them and bring improvements in their computation. We also show that combining spatial and statistical signatures increase their performance in texture classification problematics.

Paper Details

Date Published: 12 October 2006
PDF: 9 pages
Proc. SPIE 6383, Wavelet Applications in Industrial Processing IV, 63830N (12 October 2006); doi: 10.1117/12.685833
Show Author Affiliations
François Mourougaya, SIC Lab. (France)
Philippe Carré, SIC Lab. (France)
Christine Fernandez-Maloigne, SIC Lab. (France)


Published in SPIE Proceedings Vol. 6383:
Wavelet Applications in Industrial Processing IV
Frédéric Truchetet; Olivier Laligant, Editor(s)

© SPIE. Terms of Use
Back to Top