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Proceedings Paper

Geiger-mode InGaAsP/InP APDs optimized for single photon counting at 1.06 μm
Author(s): Keith Forsyth; Noah Clay
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Paper Abstract

Avalanche photodiodes optimized for Geiger-mode single photon counting at 1.06 microns have been fabricated using a quaternary InGaAsP absorber to reduce the dark count rate without sacrificing high photon detection probability. The dark count rate at a given detection probability is more than an order of magnitude lower than that of comparable Geiger-mode APDs fabricated with ternary InGaAs absorbers. Some devices show anomalous afterpulsing behavior that is reduced in severity at lower temperatures, the inverse of typical behavior. This unusual afterpulsing behavior allows for lower temperature operation without sacrificing maximum count rate, and may also offer new clues to the physical origin of afterpulsing in general.

Paper Details

Date Published: 3 November 2006
PDF: 8 pages
Proc. SPIE 6372, Advanced Photon Counting Techniques, 63720L (3 November 2006); doi: 10.1117/12.685234
Show Author Affiliations
Keith Forsyth, Sensors Unlimited Goodrich (United States)
Noah Clay, Sensors Unlimited Goodrich (United States)


Published in SPIE Proceedings Vol. 6372:
Advanced Photon Counting Techniques
Wolfgang Becker, Editor(s)

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