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Proceedings Paper

Methodology to simulate parasitic reflection and birefringence in optical pickup units and sensors
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Paper Abstract

A novel technique is presented for the computation of the polarization transfer function of optical assemblies with finite reflection coefficients, birefringence, and other parasitic imperfections. The methodology is directly applicable to optical data storage modeling, such as CD/DVD recording optics and the physical recording process.

Paper Details

Date Published: 22 June 2006
PDF: 4 pages
Proc. SPIE 6282, Optical Data Storage 2006, 628222 (22 June 2006); doi: 10.1117/12.685193
Show Author Affiliations
Robert P. Dahlgren, Univ. of California, Santa Cruz (United States)
Kenneth D. Pedrotti, Univ. of California, Santa Cruz (United States)


Published in SPIE Proceedings Vol. 6282:
Optical Data Storage 2006
Ryuichi Katayama; Tuviah E. Schlesinger, Editor(s)

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