Share Email Print
cover

Proceedings Paper

Analysis of mechanical strain and temperature profiling in high-brightness parabolic bow-tie laser arrays
Author(s): D. Masanotti; F. Causa; F. Weick; M. Ziegler; J. W. Tomm
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

With the widespread use of laser diodes in modern industry there has been an increasing demand for high optical output power devices with good beam quality and, ideally, low production and packaging costs. Reliability and long lifetime are essential requirements since they determine the extent to which such sources will be utilised. The devices of interest here are arrays of parabolic bow-tie lasers which have been specially designed to achieve high power with high brightness without the need for re-growth or sophisticated device fabrication. This paper presents a comparative study on laser diode arrays to investigate the effects of scaling and device geometry on device operation, including degradation and ageing. Temperature profiles at the array facets have been obtained using a thermal imaging system. The HgCdTe-based detector operates in the 1-5.5μm wavelength range. The results obtained indicate a smaller increase in temperature (2-5°C) in uncoupled arrays with respect to phase-coherent arrays and a considerable increase in temperature with increasing number of elements in the array. Such considerations are essential to properly manage thermal dissipation and improve the operational characteristics of such devices.

Paper Details

Date Published: 13 October 2006
PDF: 12 pages
Proc. SPIE 6368, Optoelectronic Devices: Physics, Fabrication, and Application III, 63680Y (13 October 2006); doi: 10.1117/12.685138
Show Author Affiliations
D. Masanotti, Univ. of Bath (United Kingdom)
F. Causa, Univ. of Bath (United Kingdom)
F. Weick, Max-Born-Institut für Nichtlineare Optik und Kurzzeitspektroskopie (Germany)
M. Ziegler, Max-Born-Institut für Nichtlineare Optik und Kurzzeitspektroskopie (Germany)
J. W. Tomm, Max-Born-Institut für Nichtlineare Optik und Kurzzeitspektroskopie (Germany)


Published in SPIE Proceedings Vol. 6368:
Optoelectronic Devices: Physics, Fabrication, and Application III
Joachim Piprek; Jian Jim Wang, Editor(s)

© SPIE. Terms of Use
Back to Top