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Proceedings Paper

Variable-size variable-band selection for spectral feature characterization in hyperspectral data
Author(s): Su Wang; Chein-I Chang
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Paper Abstract

This paper presents a band selection technique for spectral feature characterization in hyperspectral data, referred to as band selection for hyperspectral signature feature characterization (BSHSFC). Since a hyperspectral signature is characterized by its spectral profile, the number of bands to be selected is totally determined by spectral features that uniquely characterize the signature. As a result, two hyperspectral signatures may require different sets of bands for spectral characterization. The proposed BSHSFC is a variable-size variable-band selection (VSVBS) where the number of selected bands varies with a hyperspectral signature to be processed. In order for BSHSFC to select an appropriate set of bands for a hyperspectral signature, a new band prioritization criterion, referred to as orthogonal subspace projectorbased band prioritization criterion (OSP-BPC) is derived for this purpose. It assigns a different priority score to each spectral band of a hyperspectral signature such that various features can be captured by the BSHSFC from the original set of bands. Accordingly, the BSHSFC can be interpreted as a spectral feature extraction technique for signature characterization. Finally, experiments using two sets of data are conducted to demonstrate that the BSHSFC-based BS can improve the performance of hyperspectral signature characterization.

Paper Details

Date Published: 25 October 2006
PDF: 11 pages
Proc. SPIE 6378, Chemical and Biological Sensors for Industrial and Environmental Monitoring II, 63781B (25 October 2006); doi: 10.1117/12.684911
Show Author Affiliations
Su Wang, Univ. of Maryland, Baltimore County (United States)
Chein-I Chang, Univ. of Maryland, Baltimore County (United States)


Published in SPIE Proceedings Vol. 6378:
Chemical and Biological Sensors for Industrial and Environmental Monitoring II
Steven D. Christesen; Arthur J. Sedlacek; James B. Gillespie; Kenneth J. Ewing, Editor(s)

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