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Proceedings Paper

High-resolution imaging 1D and 2D solid state detector systems
Author(s): Tümay O. Tumer; Victoria B. Cajipe; Martin Clajus; Satoshi Hayakawa; Alexander Volkovskii
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Paper Abstract

We have developed high energy and high spatial resolution 1D and 2D solid state imaging detectors and their custom integrated circuits (ICs). Readout ICs are now regarded to be an integral part of position-sensitive semiconductor detectors, especially for Si and CdZnTe for x-ray and gamma-ray imaging. These detectors have a 1D or 2D structure. The 1D structure types are mostly used for scanning purposes with some staring type imaging while 2D pixel detectors can be used for both scanning and staring mode imaging applications. Because the requirements of various detector applications tend to be diverse, a custom IC is typically designed for a specific detector array. This often lengthens the time and raises the cost of system development. To help close the readout technology gap and facilitate advances in this field, we have been formulating and implementing strategies for instrumenting different detectors of a given application category with highly versatile ICs that meet a range of requirements. The solid-state detectors and their ICs that have been developed within this effort are presented.

Paper Details

Date Published: 30 August 2006
PDF: 11 pages
Proc. SPIE 6319, Hard X-Ray and Gamma-Ray Detector Physics and Penetrating Radiation Systems VIII, 63190P (30 August 2006); doi: 10.1117/12.684168
Show Author Affiliations
Tümay O. Tumer, Nova R&D, Inc. (United States)
Victoria B. Cajipe, Nova R&D, Inc. (United States)
Martin Clajus, Nova R&D, Inc. (United States)
Satoshi Hayakawa, Nova R&D, Inc. (United States)
Alexander Volkovskii, Nova R&D, Inc. (United States)

Published in SPIE Proceedings Vol. 6319:
Hard X-Ray and Gamma-Ray Detector Physics and Penetrating Radiation Systems VIII
F. Patrick Doty; Larry A. Franks; Arnold Burger; H. Bradford Barber; Hans Roehrig; Ralph B. James, Editor(s)

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