Share Email Print
cover

Proceedings Paper

Development of macro defects inspection system for TFT-LCD color filter glass
Author(s): Hyoung Il Son; Chan Je Jeon; Young Il Kim
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Details

Date Published:
PDF
Proc. SPIE 6375, Optomechatronic Sensors, Instrumentation, and Computer-Vision Systems, 63750J; doi: 10.1117/12.684143
Show Author Affiliations
Hyoung Il Son, SAMSUNG Electronics Co., Ltd. (South Korea)
Chan Je Jeon, SAMSUNG Electronics Co., Ltd. (South Korea)
Young Il Kim, SAMSUNG Electronics Co., Ltd. (South Korea)


Published in SPIE Proceedings Vol. 6375:
Optomechatronic Sensors, Instrumentation, and Computer-Vision Systems
Jonathan Kofman; Yasuhiro Takaya, Editor(s)

© SPIE. Terms of Use
Back to Top