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Proceedings Paper

Cerium-doped mixed-alkali rare-earth double-phosphate scintillators for x- and gamma-ray detection
Author(s): John S. Neal; Lynn A. Boatner; Merry Spurrier; Piotr Szupryczynski; Charles L. Melcher
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Paper Abstract

Previous measurements of the scintillation properties of members of the single-alkali, rare-earth double-phosphate family have demonstrated high light output and fast decay times when exposed to ionizing radiation. Cerium-doped K3Lu(PO4)2 and Rb3Lu(PO4)2 scintillators have exhibited light outputs of 32,500 and 28,200 photons/MeV respectively and decay times of 37 and 34 nanoseconds respectively. Because of the ease with which the alkali constituents (Li, Na, K, Rb, Cs) of the crystal matrix may be interchanged (e.g. K2CsLu(PO4)2 and CsLi2Lu(PO4)2), the rare-earth double-phosphate family of scintillators provides an ideal system for the study of matrix effects on scintillation efficiency and kinetics. In order to better understand and to ultimately optimize the scintillation properties of these scintillators, new members of the rare-earth double-phosphate family have been synthesized by high temperature flux growth. These new samples, represented by the general formula (A,B)3Lu(PO4)2:Ce where A and B are alkali elements, incorporate mixed alkali rather than single alkali components and varying levels of Ce doping. Light output, scintillation decay times, and photoluminescence measurements for the most promising of the samples to date are reported. In this paper, we identify promising samples and results that clearly demonstrate outstanding light output, up to 270% of BGO, fast decay times, 29-39 nanoseconds, and peak emission wavelengths of ~ 400 nm for many of the samples.

Paper Details

Date Published: 30 August 2006
PDF: 8 pages
Proc. SPIE 6319, Hard X-Ray and Gamma-Ray Detector Physics and Penetrating Radiation Systems VIII, 631907 (30 August 2006); doi: 10.1117/12.683884
Show Author Affiliations
John S. Neal, Oak Ridge National Lab. (United States)
Lynn A. Boatner, Oak Ridge National Lab. (United States)
Merry Spurrier, Univ. of Tennessee (United States)
Piotr Szupryczynski, Siemens Medical Solutions (United States)
Charles L. Melcher, Univ. of Tennessee (United States)

Published in SPIE Proceedings Vol. 6319:
Hard X-Ray and Gamma-Ray Detector Physics and Penetrating Radiation Systems VIII
F. Patrick Doty; Larry A. Franks; Arnold Burger; H. Bradford Barber; Hans Roehrig; Ralph B. James, Editor(s)

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