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Proceedings Paper

Compensation of chromatic aberration in multiwavelength digital holographic investigation of microstructures
Author(s): P. Ferraro; S. Grilli; D. Alfieri; S. De Nicola; A. Finizio; G. Pierattini
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Paper Abstract

We demonstrate that refractive index profile of microstructure could be correctly recovered in multiwavelenght digital holographic microscope when chromatic aberration is taken into account. The chromatic aberration introduced by the optical imaging components can be can be numerically compensated in the reconstruction process. The compensation approach requires the control of the reconstructed pixel size in the image plane if a Fresnel Transformation Method is adopted to take into account the different wavelengths used to investigate the samples. Description of the method and several examples of application will be discussed.

Paper Details

Date Published: 14 August 2006
PDF: 6 pages
Proc. SPIE 6293, Interferometry XIII: Applications, 629304 (14 August 2006); doi: 10.1117/12.683858
Show Author Affiliations
P. Ferraro, Istituto Nazionale di Ottica Applicata, CNR (Italy)
S. Grilli, Istituto Nazionale di Ottica Applicata, CNR (Italy)
D. Alfieri, Istituto Nazionale di Ottica Applicata, CNR (Italy)
S. De Nicola, Istituto di Cibernetica, CNR (Italy)
A. Finizio, Istituto di Cibernetica, CNR (Italy)
G. Pierattini, Istituto di Cibernetica, CNR (Italy)

Published in SPIE Proceedings Vol. 6293:
Interferometry XIII: Applications
Erik L. Novak; Wolfgang Osten; Christophe Gorecki, Editor(s)

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